Effect of samarium addition and annealing on the properties of electrodeposited ceria thin films

Thin Solid Films

Volumn 519, Issue 11, 2011, Pages 3538-3543

  Zivkovic L ^a,b   Lair, V ^a   Lupan, O ^a,c   Ringuede A ^a  

^a PSL RESEARCH UNIVERSITY   (France)

^b UNIVERSITY OF BELGRADE   (Serbia)

^c TECHNICAL UNIVERSITY OF MOLDOVA   (Moldova)

Author keywords

Electrodeposition; Fuel cells; Raman spectroscopy; Samarium doped ceria; Thin films; X ray diffraction

Indexed keywords

AS-GROWN; CERIA THIN FILMS; CRYSTALLOGRAPHIC PROPERTIES; DEPOSITION BATH; DOPED CERIA; EFFECT OF TEMPERATURE; ELECTROCHEMICAL DEPOSITION; ELECTROCHEMICAL DEVICES; ELECTRODEPOSITION METHODS; ENERGY DISPERSIVE X-RAY; FILM COMPOSITION; HIGH TEMPERATURE; LOW TEMPERATURES; PROMISING MATERIALS; SAMARIUM-DOPED CERIA; SATURATED CALOMEL ELECTRODE; SCANNING ELECTRONIC MICROSCOPY; SM ADDITION; VIBRATIONAL PROPERTIES; XRD;

ANNEALING; CERIUM COMPOUNDS; DIFFRACTION; ELECTROCHEMISTRY; ELECTRODEPOSITION; FUEL CELLS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REDUCTION; SAMARIUM; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

SPECTRUM ANALYSIS;

EID: 79952738035     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.01.245     Document Type: Article

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