Characterization of Pr- and Sm-doped Ce0.8Gd0.2O 2 - δ

Journal of Electroceramics

Volumn 13, Issue 1-3, 2004, Pages 683-689

  Torrens, R ^a   Sammes, N M ^b   Tompsett, G ^c  

^a UNIVERSITY OF WAIKATO   (New Zealand)

^b UNIVERSITY OF CONNECTICUT   (United States)

^c University of Massachusetts   (United States)

Author keywords

AC impedance; Ce0.8Gd0.2 y Pr y O2 ; Ce0.8Gd0.2 y Sm y O2 electrolytes; Raman spectroscopy; X ray diffraction

Indexed keywords

CERIUM COMPOUNDS; DOPING (ADDITIVES); ELECTROCHEMISTRY; ELECTROLYTES; IONIC CONDUCTION; LATTICE CONSTANTS; RAMAN SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

BAND SHIFTS; ELECTROLYTE MATERIALS; OXYGEN VACANCY BANDS; WAVENUMBER;

SOLID OXIDE FUEL CELLS;

EID: 17144424556     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-004-5176-x     Document Type: Conference Paper

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