Zinc phthalocyanine - Influence of substrate temperature, film thickness, and kind of substrate on the morphology

Thin Solid Films

Volumn 519, Issue 11, 2011, Pages 3939-3945

  Schunemann C ^a   Elschner, C ^a   Levin, A A ^a   Levichkova, M ^a   Leo, K ^a   Riede, M ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Crystallinity; Morphology; Organic semiconductor; Organic solar cells; Phthalocyanine; X ray diffraction

Indexed keywords

AFM; CRYSTALLINITIES; DEPOSITION PARAMETERS; DIFFERENT SUBSTRATES; ELECTRICAL APPLICATIONS; FILM DEPOSITION; LATERAL SIZES; LAYER THICKNESS; MICROSTRUCTURE ANALYSIS; ORGANIC ELECTRONICS; ORGANIC MOLECULES; ORGANIC SEMICONDUCTOR; ORGANIC SOLAR CELL; PHTHALOCYANINE; SUBSTRATE TEMPERATURE; THERMAL RELAXATION; VARIOUS SUBSTRATES; X RAY REFLECTIVITY; XRD; XRD MEASUREMENTS; ZINC PHTHALOCYANINES;

ATOMIC FORCE MICROSCOPY; CRYSTALLITE SIZE; DIFFRACTION; MORPHOLOGY; NITROGEN COMPOUNDS; SOLAR CELLS; SURFACE TENSION; X RAY DIFFRACTION; X RAYS; ZINC; ZINC COMPOUNDS;

SUBSTRATES;

EID: 79952737073     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.01.356     Document Type: Article

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