Structural and electronic implications for carrier injection into organic semiconductors

Applied Physics A: Materials Science and Processing

Volumn 97, Issue 1, 2009, Pages 1-9

  Castellani, Mauro ^a   Salzmann, Ingo ^b   Bugnon, Philippe ^c   Yu, Shuwen ^b   Oehzelt, Martin ^d   Koch, Norbert ^b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

^c EPFL   (Switzerland)

^d JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE; CARRIER INJECTION; CHARGE CARRIER INJECTION; COPPER PHTHALOCYANINE; ELECTRICAL PROPERTY; ELECTRONIC INTERFACE; ELECTRONIC LEVELS; IN-SITU; INTERFACE PROPERTY; ITO (INDIUM-TIN OXIDE); KELVIN PROBE MEASUREMENTS; NUCLEATION AND GROWTH; ORGANIC DEPOSITION; ORGANIC DIODES; ORGANIC LAYERS; ORGANIC MATERIALS; ORGANIC SEMICONDUCTOR; ORGANIC SMALL MOLECULAR; OXYGEN PLASMA PRETREATMENT; OXYGEN PLASMAS; POLYCRYSTALLINE; POLYCRYSTALLINE FILM; X- RAY DIFFRACTION;

AMORPHOUS MATERIALS; COPPER OXIDES; ELECTRIC PROPERTIES; FILM GROWTH; OXYGEN; PLASMA DEPOSITION; PLASMAS; SEMICONDUCTOR DIODES; SEMICONDUCTOR GROWTH; SUBSTRATES; TIN; TRANSPORT PROPERTIES;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 67650659797     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-009-5336-6     Document Type: Article

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