Load-pull measurement of transistor negative input impedance

2006 68th ARFTG Conference on Measurement for Emerging Technologies, ARFTG 2006

Volumn , Issue , 2018, Pages

  De Groote, Fabien ^a   Verspecht, Jan ^b   Teyssier, Jean Pierre ^a   Quere, Raymond ^a  

^a UNIVERSITY OF LIMOGES   (France)

^b Jan Verspecht bvba   (Belgium)

Author keywords

active circuits; input impedance; LSNA; nonlinearities; power measurement

Indexed keywords

CONTROL NONLINEARITIES; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC POWER MEASUREMENT; HIGH ELECTRON MOBILITY TRANSISTORS; III-V SEMICONDUCTORS; NONLINEAR OPTICS;

ACTIVE CIRCUITS; INPUT IMPEDANCE; LOAD-PULL MEASUREMENT; LOAD-PULL SETUP; LSNA; MEASUREMENT-BASED; NONLINEAR EFFECT; OUTPUT IMPEDANCE;

ELECTRIC IMPEDANCE;

EID: 79952706813     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2006.8361669     Document Type: Conference Paper

References (7)

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