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Volumn 1, Issue , 2005, Pages 617-620
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Application of a novel active envelope load pull architecture in large signal device characterization
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Author keywords
Device characterization; Load pull; Power amplifiers; Waveform measurements
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Indexed keywords
DEVICE CHARACTERIZATION;
HIGH SPEED PRODUCTION TEST;
LOAD PULL;
WAVEFORM MEASUREMENTS;
CLOSED LOOP CONTROL SYSTEMS;
ELECTRIC LOAD MANAGEMENT;
POWER AMPLIFIERS;
PROBLEM SOLVING;
SIGNAL PROCESSING;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 33847126270
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EUMC.2005.1608932 Document Type: Conference Paper |
Times cited : (9)
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References (6)
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