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Volumn , Issue , 2006, Pages 129-132
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The locus of points of constant output VSWR around the load optimal impedance: Evaluation of power transistors robustness
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROWAVE MEASUREMENT;
POWER TRANSISTORS;
CONSTANT OUTPUT VOLTAGE;
FUNDAMENTAL FREQUENCIES;
MULTI-HARMONIC LOADS;
SI/SIGE;
STMICROELECTRONICS;
TEST BENCHES;
ELECTRIC POWER SYSTEM MEASUREMENT;
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EID: 60649098611
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTG.2006.4734357 Document Type: Conference Paper |
Times cited : (2)
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References (3)
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