Self-referenced interferometry for the characterization of axicon lens quality

Applied Optics

Volumn 47, Issue 9, 2008, Pages 1200-1205

  Kupka, David ^a   Schlup, Philip ^a   Bartels, Randy A ^a  

^a Department of Mechanical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR PHYSICS; OPTICS;

INTERFERENCE FRINGE; INTERFERENCE PATTERNS; LENS QUALITY; PHASE DISTRIBUTION; PHASE MAPS; RADIAL SYMMETRYS; REFERENCE BEAMS; REFERENCE WAVES;

INTERFEROMETRY;

EID: 49249116014     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.001200     Document Type: Article

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