Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods

Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2772-2776

  Rodenhausen, K B ^a,b   Schubert, M ^a,b  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Organic thin films; Quartz crystal microbalance; Spectroscopic ellipsometry

Indexed keywords

IN-SITU; INDEX OF REFRACTION; MOLECULAR POLARIZABILITIES; ORGANIC ADSORBENTS; ORGANIC THIN FILMS; QUARTZ CRYSTAL; QUARTZ CRYSTAL MICROBALANCE WITH DISSIPATION; SOLVENT CONTENT; SURFACE CHARACTERIZATION; THIN FILM FORMATION;

ADSORPTION; FILM THICKNESS; PIEZOELECTRIC DEVICES; QUARTZ; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; ULTRATHIN FILMS;

QUARTZ CRYSTAL MICROBALANCES;

EID: 79952630539     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.11.079     Document Type: Article

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