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Volumn 13, Issue 4, 2010, Pages 288-294
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Growth of highly (1 1 1) oriented CuIn0.75Al 0.25Se2 thin films
a
VIT UNIVERSITY
(India)
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Author keywords
Electron Diffraction; Optical properties; Raman spectra; Semiconductor thin films; X ray Diffraction
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Indexed keywords
ABSORPTION COEFFICIENTS;
DIRECT BAND GAP;
ELECTRON DIFFRACTION STUDY;
FUNDAMENTAL ABSORPTION EDGE;
GLASS SUBSTRATES;
MICRO-RAMAN SPECTRA;
OPTICAL ABSORPTION STUDIES;
POLYCRYSTALLINE;
PREFERRED ORIENTATIONS;
RAMAN SPECTRA;
SEMICONDUCTOR THIN FILMS;
SINGLE PHASE;
SPHALERITE STRUCTURE;
ABSORPTION;
ELECTRON DIFFRACTION;
OPTICAL PROPERTIES;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION;
X RAYS;
ZINC SULFIDE;
SEMICONDUCTING SELENIUM COMPOUNDS;
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EID: 79952625894
PISSN: 13698001
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mssp.2010.10.017 Document Type: Article |
Times cited : (8)
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References (25)
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