Structural and gas-sensing properties of CuO-CuxFe 3-xO4 nanostructured thin films

Sensors and Actuators, B: Chemical

Volumn 153, Issue 1, 2011, Pages 117-124

  Chapelle, Audrey ^a   Yaacob, Mohd H ^b,c   Pasquet, Isabelle ^a   Presmanes, Lionel ^a   Barnabé, Antoine ^a   Tailhades, Philippe ^a   Plessis, Johan Du ^b   Kalantar Zadeh, Kourosh ^b  

^a UNIVERSITÉ PAUL SABATIER   (France)

^b RMIT UNIVERSITY   (Australia)

^c UNIVERSITY PUTRA MALAYSIA   (Malaysia)

Author keywords

Copper oxide; Gas sensor; Nanocomposite; RF sputtering; Spinel ferrite

Indexed keywords

A-THERMAL; ARGON PRESSURE; DEPOSITION CONDITIONS; ELECTRICAL MEASUREMENT; GAS SENSING; GAS SENSING PROPERTIES; GAS SENSOR; GRAZING INCIDENCE X-RAY DIFFRACTION; HYDROGEN GAS; MICRO-STRUCTURAL; NANOCRYSTALLINE CUO; NANOSTRUCTURED THIN FILM; RADIO FREQUENCY SPUTTERING; RECOVERY TIME; RF-SPUTTERING; SEM; SENSING PROPERTY; SPINEL FERRITE; SUBSTRATE DISTANCE; SYNTHETIC AIR; TEM;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHEMICAL SENSORS; FERRITE; FERRITES; GAS DETECTORS; GASES; NANOCOMPOSITES; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ARGON;

EID: 79952486268     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2010.10.018     Document Type: Article

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