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Volumn 65, Issue 8, 2011, Pages 1238-1240
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Greatly enhanced infrared normal spectral emissivity of microstructured silicon using a femtosecond laser
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Author keywords
Femtosecond laser pulses; Infrared normal spectral emissivity; Laser processing; Microstructure
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Indexed keywords
BLACKBODY SOURCES;
FEMTO-SECOND LASER;
FEMTOSECOND LASER IRRADIATION;
FEMTOSECOND LASER PULSE;
INFRARED NORMAL SPECTRAL EMISSIVITY;
LASER PROCESSING;
MICROBOLOMETER;
NORMAL SPECTRAL EMISSIVITIES;
SILICON-BASED;
WAVELENGTH RANGES;
WAVELENGTH REGIONS;
ELECTROMAGNETIC WAVE EMISSION;
MICROSTRUCTURE;
ULTRAFAST LASERS;
ULTRASHORT PULSES;
INFRARED LASERS;
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EID: 79952447546
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matlet.2011.01.067 Document Type: Article |
Times cited : (26)
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References (12)
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