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Volumn 253, Issue 1, 2010, Pages
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Study of As2Se3 and As2Se2Te glass structure by neutron- and X-ray diffraction methods
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BOND STRENGTH (CHEMICAL);
CARBON FILMS;
ENERGY GAP;
ION BEAMS;
ION BOMBARDMENT;
ION IMPLANTATION;
MOLECULAR ELECTRONICS;
OPTICAL FILMS;
OPTICAL PROPERTIES;
PHOTOELECTRON SPECTROSCOPY;
PHOTOELECTRONS;
PHOTONS;
SEMICONDUCTING SELENIUM COMPOUNDS;
SILICON;
THIN FILMS;
X RAY DIFFRACTION;
ABSORPTION CO-EFFICIENT;
CARBON CONTENT;
GLASS STRUCTURE;
R.F. MAGNETRON SPUTTERING;
SILICON CARBON BOND;
STRUCTURAL MODIFICATIONS;
X RAY PHOTOELECTRON SPECTRA;
X-RAY DIFFRACTION METHOD;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 79952432801
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/253/1/012053 Document Type: Conference Paper |
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Times cited : (19)
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References (16)
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