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Volumn 460, Issue 1-2, 2008, Pages 570-576
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Short-range order analysis and electrical properties of As30Se70-xSnx glassy system
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Author keywords
Amorphous materials; Semiconductors; X ray diffraction
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Indexed keywords
ARSENIC COMPOUNDS;
ELECTRIC PROPERTIES;
EVAPORATION;
STATISTICAL METHODS;
X RAY DIFFRACTION;
GLASSY SYSTEMS;
INTERATOMIC DISTANCES;
SHORT-RANGE ORDER ANALYSIS;
STRUCTURAL PARAMETERS;
AMORPHOUS FILMS;
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EID: 44449142356
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2007.06.013 Document Type: Article |
Times cited : (13)
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References (30)
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