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Volumn 460, Issue 1-2, 2008, Pages 570-576

Short-range order analysis and electrical properties of As30Se70-xSnx glassy system

Author keywords

Amorphous materials; Semiconductors; X ray diffraction

Indexed keywords

ARSENIC COMPOUNDS; ELECTRIC PROPERTIES; EVAPORATION; STATISTICAL METHODS; X RAY DIFFRACTION;

EID: 44449142356     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.06.013     Document Type: Article
Times cited : (13)

References (30)
  • 1
    • 0022287832 scopus 로고
    • Adler D., Fritzsche H., and Gvshinsky S.R. (Eds), Plenum Press, New York/London
    • Kolomiets B.T., and Averyanov V.L. In: Adler D., Fritzsche H., and Gvshinsky S.R. (Eds). Physics of Disordered Materials (1985), Plenum Press, New York/London 663
    • (1985) Physics of Disordered Materials , pp. 663
    • Kolomiets, B.T.1    Averyanov, V.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.