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Review of Scientific Instruments

Volumn 82, Issue 2, 2011, Pages

Calorimetry of epitaxial thin films

(6) Cooke, David W a Hellman, F a Groves, J R b Clemens, B M b Moyerman, S c Fullerton, E E c

a UNIVERSITY OF CALIFORNIA (United States)

b Stanford University (United States)

c UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MEMBRANES; BULK CRYSTALS; CALORIMETRIC TECHNIQUES; EPITAXIAL THIN FILMS; HEAT CAPACITIES; HIGH QUALITY; LITERATURE DATA; MICRO-CALORIMETRY; MICROCALORIMETER; NANO SCALE; NANOCALORIMETRY; NEW MATERIAL; SUSPENDED MEMBRANES; SYNCHROTRON X RAY DIFFRACTION;

AMORPHOUS FILMS; CALORIMETERS; CALORIMETRY; DEPOSITION; DIFFRACTION; EPITAXIAL GROWTH; FILM GROWTH; ION BEAM ASSISTED DEPOSITION; METASTABLE PHASES; RHODIUM; SPECIFIC HEAT; VAPOR DEPOSITION; X RAY DIFFRACTION;

EPITAXIAL FILMS;

EID: 79952159103 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3554440 Document Type: Article

Times cited : (19)

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