Calculation of frequency-dependent coercive field based on the investigation of intrinsic switching kinetics of strained Pb(Zr 0.2Ti0.8)O3 thin films

Journal of Physics D: Applied Physics

Volumn 44, Issue 10, 2011, Pages

  Li, Wei ^a,b   Chen, Zhijun ^a   Auciello, Orlando ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ASM AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION FIELDS; COERCIVE FIELD; EXTENDED DEFECT; FERROELECTRIC HYSTERESIS LOOP; FREQUENCY DEPENDENCE; FREQUENCY-DEPENDENT; FUNCTION OF FREQUENCY; HIGH QUALITY; POWER-LAW RELATIONSHIP; PULSE WIDTH; SWITCHING KINETICS;

COERCIVE FORCE; FERROELECTRICITY; HYSTERESIS; HYSTERESIS LOOPS; LEAD; SWITCHING; THIN FILMS; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 79952132577     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/10/105404     Document Type: Article

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