A routine procedure for the characterisation of polycapillary X-ray semi-lenses in parallelising mode with SEM/EDS

Journal of Analytical Atomic Spectrometry

Volumn 26, Issue 3, 2011, Pages 499-504

  Rackwitz, Vanessa ^a   Procop, Mathias ^b   Bjeoumikhova, Semfira ^b   Panne, Ulrich ^a,c   Hodoroaba, Vasile Dan ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b Institute for Scientific Instruments GmbH   (Germany)

^c HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISATION; ENERGY DISPERSIVE SPECTROMETERS; FOCAL DISTANCES; KEY ISSUES; LENS PARAMETERS; POLYCAPILLARIES; QUANTITATIVE RESULT; SCANNING ELECTRON MICROSCOPES; SEM/EDS; X RAY BEAM;

SCANNING ELECTRON MICROSCOPY; X RAYS;

OPTICAL INSTRUMENTS;

EID: 79951938559     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c0ja00135j     Document Type: Article

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