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Volumn , Issue , 2010, Pages 2145-2148

A novel Pt-Ti-O gate Si-metal-insulator-semiconductor field-effect transistor hydrogen gas sensor

Author keywords

[No Author keywords available]

Indexed keywords

DILUTED HYDROGEN; GATE STRUCTURE; HYDROGEN GAS SENSORS; HYDROGEN SENSOR; LIFE-TIMES; LINEAR FUNCTIONS; LONG LIFE; METAL-INSULATOR-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS; MIXED LAYER; MOSFETS; NANOCRYSTALLINES; OXYGEN-DOPED; SENSING AMPLITUDE; SI SUBSTRATES; TEMPERATURE AGING;

EID: 79951885638     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2010.5690525     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 1
    • 0020253212 scopus 로고
    • Bilister Formation in Pd Gate MIS Hydrogen Sensors
    • M.Armgarth and C.Nylander, "Bilister Formation in Pd Gate MIS Hydrogen Sensors", IEEE Trans. Electron Device Lett. EDL-3, pp. 384-386 ,1982.
    • (1982) IEEE Trans. Electron Device Lett. , vol.EDL-3 , pp. 384-386
    • Armgarth, M.1    Nylander, C.2
  • 5
    • 79951935552 scopus 로고
    • Planar GaAs Integrated Circuits Fabricated by Ion Implantation
    • B.M.Welch and R.C.Eden, "Planar GaAs Integrated Circuits Fabricated by Ion Implantation", IEDM Tech. Digest., pp.205-208, 1977.
    • (1977) IEDM Tech. Digest. , pp. 205-208
    • Welch, B.M.1    Eden, R.C.2
  • 6
    • 0023995347 scopus 로고
    • Photo-CVD SiN Assisted Self-Aligned Metal Contact Technology for High-Speed GaAs Devices
    • T.Usagawa and H.Okuhira, "Photo-CVD SiN Assisted Self-Aligned Metal Contact Technology for High-Speed GaAs Devices", Jap.J. Appl. Phys. 27, pp. 653-657, 1988.
    • (1988) Jap.J. Appl. Phys. , vol.27 , pp. 653-657
    • Usagawa, T.1    Okuhira, H.2
  • 7
    • 0021125986 scopus 로고
    • No Blister Formation Pd/Pt Double Metal Gate MISFET Hydrogen Sensors
    • S.Y.Choi, K.Takahashi, and T.Matsuo, "No Blister Formation Pd/Pt Double Metal Gate MISFET Hydrogen Sensors", IEEE Trans. Electron Device Lett. EDL-5, pp. 14-15, 1984.
    • (1984) IEEE Trans. Electron Device Lett. , vol.EDL-5 , pp. 14-15
    • Choi, S.Y.1    Takahashi, K.2    Matsuo, T.3
  • 8
    • 77950672617 scopus 로고    scopus 로고
    • Air-Annealing Effects for Pt/Ti Gate Si-Metal-Oxide-Semiconductor Field-Effect Transistors Hydrogen Gas Sensors
    • T. Usagawa and Y.Kikuchi, "Air-Annealing Effects for Pt/Ti Gate Si-Metal-Oxide-Semiconductor Field-Effect Transistors Hydrogen Gas Sensors", Appl. Phys. Express 3, 047201, 2010.
    • (2010) Appl. Phys. Express , vol.3 , pp. 047201
    • Usagawa, T.1    Kikuchi, Y.2
  • 9
    • 77958162454 scopus 로고    scopus 로고
    • A Pt-Ti-O gate Si-metal-oxide-semiconductor field-effect transistors hydrogen gas sensors
    • to be published in
    • T.Usagawa and Y.Kikuchi, "A Pt-Ti-O gate Si-metal-oxide- semiconductor field-effect transistors hydrogen gas sensors", to be published in J. Appl. Phys..
    • J. Appl. Phys.
    • Usagawa, T.1    Kikuchi, Y.2
  • 11
    • 34247176157 scopus 로고    scopus 로고
    • Oxygen interference mechanism of platinum-FET hydrogen gas sensor
    • T.Yamaguchi, T. Kiwa, K. Tsukada, and K. Yokosawa, "Oxygen interference mechanism of platinum-FET hydrogen gas sensor", Sens. Actuators A 136, pp.244-248, 2007.
    • (2007) Sens. Actuators A , vol.136 , pp. 244-248
    • Yamaguchi, T.1    Kiwa, T.2    Tsukada, K.3    Yokosawa, K.4
  • 12
    • 77958177794 scopus 로고    scopus 로고
    • Developments and Lifetime Evaluations for Low Power Si-MOSFET Hydrogen Gas Sensors
    • in Japanese
    • T. Usagawa,Y.Kikuchi, S.Nakano, and D.Kamoto, "Developments and Lifetime Evaluations for Low Power Si-MOSFET Hydrogen Gas Sensors", J.Fuel Cell.Technology 8, pp.88-96, 2009 [in Japanese].
    • (2009) J.Fuel Cell.Technology , vol.8 , pp. 88-96
    • Usagawa, T.1    Kikuchi, Y.2    Nakano, S.3    Kamoto, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.