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Volumn , Issue , 2010, Pages 1941-1945

Scrubbing with partial side information for radiation-tolerant memory

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; CHANNEL CODING; CONCATENATED CODES; CYTOLOGY; DECODING; DEFECTS; ERROR CORRECTION; RADIATION HARDENING; SIGNAL ENCODING; SPACE APPLICATIONS;

EID: 79951869051     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/GLOCOMW.2010.5700282     Document Type: Conference Paper
Times cited : (5)

References (19)
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  • 4
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    • Investigation of Memory Protection Using Low-Density Parity-Check (LDPC) Codes
    • presented at
    • S. Jeon, E. Hwang, B. V. K. Vijaya Kumar, and M. K. Cheng, "Investigation of Memory Protection Using Low-Density Parity-Check (LDPC) Codes," presented at IEEE NVMTS 2009, 2009.
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    • Edmonds, L.D.1
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    • L012607-K9F4G08U0A.pdf
    • T. Oldham et. al., "Heavy Ion SEE Test Report for the Samsung 4Gbit NAND Flash Memory," NASA/GSFC Radiation Effects Analysis, http://radhome.gsfc.nasa.gov, L012607-K9F4G08U0A.pdf, 2007.
    • (2007) NASA/GSFC Radiation Effects Analysis
    • Oldham, T.1
  • 10
    • 77950960219 scopus 로고    scopus 로고
    • Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
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    • On the Capacity of Computer Memory with Defects
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.