Total ionizing dose and displacement damage compendium of candidate spacecraft electronics for NASA

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2009, Pages 25-31

  Cochran, Donna J ^a   Buchner, Stephen P ^a   Chen, Dakai ^a   Kim, Hak S ^b   LaBel, Kenneth A ^a   Oldham, Timothy R ^b   Campola, Michael J ^b   O'Bryan, Martha V ^a   Ladbury, Raymond L ^a   Marshall, Cheryl ^b   Sanders, Anthony B ^b   Xapsos, Michael A ^b  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b NONE

Author keywords

Displacement damage; Optoelectronics; Proton damage; Single event effects; Total ionizing dose

Indexed keywords

DISPLACEMENT DAMAGES; HYBRID DEVICES; LINEAR BIPOLAR DEVICES; PROTON DAMAGE; SINGLE EVENT EFFECTS; SPACECRAFT ELECTRONICS; TOTAL IONIZING DOSE;

BIPOLAR INTEGRATED CIRCUITS; DIGITAL DEVICES; IONIZING RADIATION; NASA; PROTONS; SPACECRAFT; TECHNICAL PRESENTATIONS;

RADIATION EFFECTS;

EID: 77950960219     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2009.5336318     Document Type: Conference Paper

References (3)

1. M. O'Bryan, et al., "Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA." submitted to the 2009 IEEE NSREC Radiation Effects Data Workshop.
2. Department of Defense "Test Method Standard Microcircuits," MIL-STD-883 Test Method 1019.7 Ionizing radiation (total dose) test procedure, September 30, 2006, http:/www.dscc.dla.mil/downloads/MIL-STD-883/std883.pdf.
3. NASA/GSFC Radiation Effects and Analysis home page, http://radhome.gsfc. nasa.gov.