Direct observation of RTN-induced SRAM failure by accelerated testing and its application to product reliability assessment

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2010, Pages 189-190

  Takeuchi, K ^a   Nagumo, T ^a   Takeda, K ^a   Asayama, S ^a   Yokogawa, S ^a   Imai, K ^a   Hayashi, Y ^a  

^a RENESAS TECHNOLOGY CORP   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED TESTING; DIRECT OBSERVATION; MONTE CARLO; OPERATION CONDITIONS; PHYSICS-BASED; PRODUCT RELIABILITY; RANDOM TELEGRAPH NOISE; SIMULATION PROGRAM; SRAM FAILURES; TEST RESULTS; ULTRA-FAST;

RELIABILITY ANALYSIS; TELEGRAPH;

STATIC RANDOM ACCESS STORAGE;

EID: 77957872830     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2010.5556222     Document Type: Conference Paper

References (6)

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5. T. Nagumo et al., 2009 IEDM, p.759.
6. S. O. Toh et al., 2009 IEDM, p.767.