Bayesian hierarchical model for combining misaligned two-resolution metrology data

IIE Transactions (Institute of Industrial Engineers)

Volumn 43, Issue 4, 2011, Pages 242-258

  Xia, Haifeng ^a   Ding, Yu ^b   Mallick, Bani K ^c  

^a DOW CHEMICAL COMPANY   (United States)

^b Texas AandM University   (United States)

^c TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Coordinate measuring machine; Gaussian process; misalignment; multi resolution measurements

Indexed keywords

BAYESIAN HIERARCHICAL MODEL; DATA POINTS; DATA SETS; GAUSSIAN PROCESSES; GEOMETRIC QUALITY; HIGH RESOLUTION; METROLOGY DATA; MISALIGNMENT; MULTI-RESOLUTIONS; SIMULATED DATA; SINE-WAVE;

BAYESIAN NETWORKS; COORDINATE MEASURING MACHINES; FORECASTING; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); HIERARCHICAL SYSTEMS; MEASUREMENTS; SCANNING;

ALIGNMENT;

EID: 79951821799     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/0740817X.2010.521804     Document Type: Article

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