Direct current dielectric barrier discharges under voltages below the ionization potential of neutrals in electrode systems with one-dimensional nanostructures

Applied Physics Letters

Volumn 98, Issue 6, 2011, Pages

  Hou, Zhongyu ^a   Zhou, Weimin ^b   Wang, Yanyan ^a   Cai, Bingchu ^a  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b Shanghai Nanotechnology Promotion Center   (China)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; DIELECTRIC BARRIER DISCHARGES; DIRECT CURRENT; DIRECT-CURRENT DISCHARGE; ELECTRODE SYSTEMS; FIELD EXCITATIONS; FIRST IONIZATION POTENTIALS; GAP SIZE; INELASTIC COLLISION; INELASTIC IMPACT; IONIZATION MECHANISMS; MICROMETER SCALE; ONE-DIMENSIONAL NANOSTRUCTURE; QUASI-STATIONARY; UNDER VOLTAGE;

DIELECTRIC DEVICES; ELECTRIC DISCHARGES; LAKES; NANOSTRUCTURES;

IONIZATION POTENTIAL;

EID: 79951800595     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3552709     Document Type: Article

References (15)

1. R. Rosen, W. Simendinger, C. Debbault, H. Shimoda, L. Fleming, B. Stoner, and O. Zhou, Appl. Phys. Lett. 0003-6951 76, 1668 (2000). 10.1063/1.126130
2. A. Modi, N. Koratkar, E. Lass, B. Q. Wei, and P. M. Ajayan, Nature (London) 0028-0836 424, 171 (2003). 10.1038/nature01777 (Pubitemid 36858681)
3. J. W. Torres and R. S. Dhariwal, Nanotechnology 0957-4484 10, 102 (1999). 10.1088/0957-4484/10/1/020
4. R. Tirumala and D. B. Go, Appl. Phys. Lett. 0003-6951 97, 151502 (2010). 10.1063/1.3497231
5. S. J. Park, J. G. Eden, and K. H. Park, Appl. Phys. Lett. 0003-6951 84, 4481 (2004). 10.1063/1.1755845
6. Z. Y. Hou, B. C. Cai, and D. Xu, Appl. Phys. Lett. 0003-6951 92, 223505 (2008). 10.1063/1.2938875
7. N. Benard, J. Jolibois, E. Moreau, R. Sosa, G. Artana, and G. Tochard, Thin Solid Films 0040-6090 516, 6660 (2008). 10.1016/j.tsf.2007.11.039
8. K. P. Singh and S. Roy, Appl. Phys. Lett. 0003-6951 89, 011501 (2006). 10.1063/1.2218770 (Pubitemid 44025405)
9. Z. Y. Hou, J. H. Wu, W. M. Zhou, X. Wei, D. Xu, Y. F. Zhang, and B. C. Cai, IEEE Trans. Electron Devices 0018-9383 54, 1545 (2007). 10.1109/TED.2007.896370 (Pubitemid 46947803)
10. Z. Y. Hou, B. C. Cai, and H. Liu, Appl. Phys. Lett. 0003-6951 94, 163506 (2009). 10.1063/1.3123170
11. c, the estimation of field excitation, and the estimation of leakage issue.
12. A. V. Engel, Ionization Gases (Oxford Press, Oxford, London, 1955) Chaps., pp. 48 and 132.
13. S. Geltman, J. Phys. B 0022-3700 33, 4769 (2000). 10.1088/0953-4075/33/ 21/320
14. S. M. Lyth and S. R. P. Silva, Appl. Phys. Lett. 0003-6951 94, 123102 (2009). 10.1063/1.3094755
15. L. J. Uhlmann, R. G. Dall, A. G. Truscott, M. D. Hoogerland, K. G. H. Baldwin, and S. J. Buckman, Phys. Rev. Lett. 0031-9007 94, 173201 (2005). 10.1103/PhysRevLett.94.173201 (Pubitemid 41492251)