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Volumn , Issue , 2010, Pages 150-155

Improving the reliability of a FPGA using fault-tolerance mechanism based on magnetic memory (MRAM)

Author keywords

FPGA; Memory; MRAM; Semiconductors; SEU and fault tolerance

Indexed keywords

FPGA; MEMORY; MRAM; SEMICONDUCTORS; SEU AND FAULT-TOLERANCE;

EID: 79951742214     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ReConFig.2010.10     Document Type: Conference Paper
Times cited : (2)

References (29)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.