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Volumn , Issue , 1999, Pages 77-82

Effect of oxidation on mold compound-copper leadframe adhesion

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; BOND STRENGTH (MATERIALS); COPPER; COPPER ALLOYS; INTERFACES (MATERIALS); MOLDS; OXIDATION; TESTING;

EID: 79951655812     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.1999.757291     Document Type: Conference Paper
Times cited : (15)

References (9)
  • 4
    • 85037080085 scopus 로고
    • Investigation on the effect of copper I. Eadframe oxidation on package delamination
    • C.T. Chong, A. Ieslie, L.T. Beng and C. Lee, "Investigation on the Effect of Copper I. eadframe Oxidation on Package Delamination", IEEE 45th ECT Conference, 463, 1995.
    • (1995) IEEE 45th ECT Conference , vol.463
    • Chong, C.T.1    Ieslie, A.2    Beng, L.T.3    Lee, C.4
  • 6
    • 0026406133 scopus 로고
    • The role of plastic package adhesion in IC performance
    • S. Kim, "The Role of Plastic Package Adhesion in IC Performance", IEEE 41st ECT Conference, 750, 1991.
    • (1991) IEEE 41st ECT Conference , vol.750
    • Kim, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.