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Volumn , Issue , 1999, Pages 275-281

An oxidation study of Cu leadframes

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLYTIC REDUCTION; INTERFACES (MATERIALS); MASS SPECTROMETRY; PACKAGING MATERIALS; SCANNING PROBE MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE ROUGHNESS;

EID: 85037125917     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.1999.757326     Document Type: Conference Paper
Times cited : (18)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.