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Volumn , Issue , 1999, Pages 275-281
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An oxidation study of Cu leadframes
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROLYTIC REDUCTION;
INTERFACES (MATERIALS);
MASS SPECTROMETRY;
PACKAGING MATERIALS;
SCANNING PROBE MICROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
SURFACE ROUGHNESS;
ELECTROCHEMICAL REDUCTION ANALYSIS;
LEAD FRAME;
MICRO INDENTATION;
OXIDE LAYER;
SECONDARY ION MASS SPECTROSCOPIES (SIMS);
VICKERS;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 85037125917
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISAPM.1999.757326 Document Type: Conference Paper |
Times cited : (18)
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References (7)
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