Kelvin probe force microscopy of defects in ZnO nanocrystals associated with emission at 3.31 eV

Applied Physics Express

Volumn 4, Issue 2, 2011, Pages

  Kurbanov, Saidislam ^a,b   Yang, Woo Chul ^a   Kang, Tae Won ^a  

^a Dongguk University   (South Korea)

^b S YU YUNUSOV INSTITUTE OF THE CHEMISTRY OF PLANT SUBSTANCES   (Uzbekistan)

Author keywords

[No Author keywords available]

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; NANOCRYSTAL SURFACE; POTENTIAL VARIATIONS; RANDOMLY DISTRIBUTED; STRUCTURAL DEFECT; ZNO NANOCRYSTAL;

NANOCRYSTALS; PROBES; SURFACE POTENTIAL; SURFACE PROPERTIES; ZINC OXIDE;

SURFACE DEFECTS;

EID: 79951655520     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.4.021101     Document Type: Article

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