Facile synthesis and electrical properties of silver wires through chemical reduction by polyaniline

Journal of Physical Chemistry C

Volumn 114, Issue 50, 2010, Pages 22147-22154

  Xu, Ping ^a,b   Jeon, Sea Ho ^a   Chen, Hou Tong ^a   Luo, Hongmei ^c   Zou, Guifu ^a   Jia, Quanxi ^a   Anghel, Marian ^a   Teuscher, Christof ^d   Williams, Darrick J ^a   Zhang, Bin ^b   Han, Xijiang ^b   Wang, Hsing Lin ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

^c New Mexico State University   (United States)

^d Portland State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BREAK DOWN; CHEMICAL REDUCTION; CURRENT VOLTAGE CURVE; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; ELECTRICAL STABILITY; ENHANCED SURFACE; FACILE FABRICATION; FACILE SYNTHESIS; FOUR-PROBE METHODS; GROWTH DEFECTS; GROWTH MECHANISMS; I - V CURVE; METAL NANOWIRE; NANOELECTRONIC DEVICES; POTENTIAL RANGE; PROBE METHODS; REAL TIME; RESISTANCE BEHAVIORS; ROOM TEMPERATURE; SELF-ASSEMBLED; SILVER METAL; SILVER NANOPARTICLES; SILVER NITRATES; SILVER WIRES; SMOOTH SURFACE; SURFACE TRANSFORMATIONS; TEMPERATURE-DEPENDENT RESISTANCE; TIME-RESOLVED;

ELECTRIC CONDUCTIVITY; MORPHOLOGY; NANOELECTRONICS; NANOWIRES; OPTICAL MICROSCOPY; POLYANILINE; PROBES; SURFACE DEFECTS; WIRE;

SILVER;

EID: 79951647605     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp109207d     Document Type: Article

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