Subdiffraction limited, remote excitation of surface enhanced raman scattering

Nano Letters

Volumn 9, Issue 3, 2009, Pages 995-1001

  Hutchison, James A ^a   Centeno, Silvia P ^a   Odaka, Hideho ^a   Fukumura, Hiroshi ^b   Hofkens, Johan ^a   Uji i, Hiroshi ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTIONS; HOT-SPOTS; IMAGING APPLICATIONS; NANO PARTICLES; PLASMON WAVEGUIDES; SERS SPECTRUM; SILVER NANOWIRES; SUB DIFFRACTIONS; SUB-DIFFRACTION LIMITS; SURFACE ENHANCED RAMAN SCATTERINGS; SURFACE PLASMON-POLARITON; WAVEGUIDE EXCITATIONS;

ADSORPTION; ELECTRIC WIRE; MICROMETERS; NANOWIRES; PLASMONS; RAMAN SCATTERING; SILVER; SURFACE PLASMON RESONANCE; SURFACES; THICKNESS MEASUREMENT; WAVEGUIDES;

LASER EXCITATION;

CARBON NANOTUBE; NANOPARTICLE; NANOWIRE; PHENOL DERIVATIVE; THIOL DERIVATIVE; THIOPHENOL;

ADSORPTION; ARTICLE; CHEMISTRY; ELECTROMAGNETIC FIELD; LIGHT; METHODOLOGY; RAMAN SPECTROMETRY; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY;

ADSORPTION; ELECTROMAGNETIC FIELDS; LIGHT; MICROSCOPY, SCANNING PROBE; NANOPARTICLES; NANOTUBES, CARBON; NANOWIRES; PHENOLS; SPECTRUM ANALYSIS, RAMAN; SULFHYDRYL COMPOUNDS; SURFACE PROPERTIES;

EID: 65249106208     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl8030696     Document Type: Article

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