Naïve bayes software defect prediction model

2010 International Conference on Computational Intelligence and Software Engineering, CiSE 2010

Volumn , Issue , 2010, Pages

  Wang, Tao ^a   Li, Wei Hua ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

Na ve bayes; Software defect prediction; Software metrics; Statistical methods

Indexed keywords

ALGORITHM COMPLEXITY; BAYES THEORY; BENCHMARKING DATA; DATA MINING METHODS; DEFECT PREDICTION; ESTIMATION METHODS; PREDICTION PERFORMANCE; SOFTWARE DEFECT PREDICTION; SOFTWARE METRICS; SOFTWARE QUALITY; STATIC CODES; TESTING EFFICIENCY;

ARTIFICIAL INTELLIGENCE; COMPUTER SOFTWARE SELECTION AND EVALUATION; DECISION TREES; FORECASTING; MATHEMATICAL MODELS; SOFTWARE ENGINEERING; STATISTICS;

DATA MINING;

EID: 79951636673     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CISE.2010.5677057     Document Type: Conference Paper

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