New nonlinear phenomena under conditions of strong selective reflection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7993, Issue , 2011, Pages

  Fofanov, Ya A ^a  

^a INSTITUTE FOR ANALYTICAL INSTRUMENTATION   (Russian Federation)

Author keywords

High sensitive optical measurements; Nanophotonics; Noise of laser radiation; Nonlinear and quantum optics; Selective reflection; Spectroscopy; Squeezed light

Indexed keywords

NOISE OF LASER RADIATION; NONLINEAR AND QUANTUM OPTICS; OPTICAL MEASUREMENT; SELECTIVE REFLECTION; SQUEEZED LIGHT;

BIOELECTRIC PHENOMENA; GLASS LASERS; HEATING; LASER RADIATION; LIGHT; MULTIPHOTON PROCESSES; NANOPHOTONICS; NONLINEAR OPTICS; OPTICAL DATA PROCESSING; OPTICAL MATERIALS; OPTICAL VARIABLES MEASUREMENT; PHOTONS; QUANTUM ELECTRONICS; QUANTUM OPTICS; REFLECTION; REFRACTIVE INDEX; RESONANCE; RUBIDIUM;

LIGHT REFLECTION;

EID: 79951607055     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.882693     Document Type: Conference Paper

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