Enhancement of Raman scattering by individual dielectric microspheres

Journal of Raman Spectroscopy

Volumn 42, Issue 2, 2011, Pages 145-148

  Du, C L ^a   Kasim, J ^b   You, Y M ^b   Shi, D N ^a   Shen, Z X ^b  

^a NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

beam diameter; enhanced Raman scattering; enhancement factor; individual polystyrene microspheres; normalized enhancement factor

Indexed keywords

FINITE ELEMENT METHOD; MICROSPHERES; POLYSTYRENES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON;

BEAM DIAMETERS; BRILLIANT CRESYL BLUE; DIELECTRIC MICROSPHERES; ENHANCED RAMAN SCATTERING; ENHANCEMENT FACTOR; INDIVIDUAL POLYSTYRENE MICROSPHERE; NORMALIZED ENHANCEMENT FACTOR; POLYSTYRENE MICRO-SPHERES; RAMAN SIGNAL;

ELECTROMAGNETIC SIMULATION;

EID: 79951599949     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.2684     Document Type: Article

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