SCOPUS 정보 검색 플랫폼

Volumn 82, Issue 1, 2011, Pages

The art of electrochemical etching for preparing tungsten probes with controllable tip profile and characteristic parameters

(3) Ju, Bing Feng a Chen, Yuan Liu a Ge, Yaozheng a

a ZHEJIANG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC FLOW; CHARACTERISTIC PARAMETER; CONE ANGLE; DIFFERENT SPEED; DIP-PEN NANOLITHOGRAPHY; DIVERSE FIELDS; EFFECTIVE CONTACT; EXPERIMENTAL APPARATUS; MICRO-PROBES; NECK-IN; OPTIMIZED ETCHING; REPRODUCIBILITIES; STATIC AND DYNAMIC; TIP APEX; TUNGSTEN PROBES; TUNGSTEN WIRES;

ASPECT RATIO; ELECTROCHEMISTRY; FABRICATION; PROBES; SCANNING PROBE MICROSCOPY; TUNGSTEN; WIRE;

ELECTROCHEMICAL ETCHING;

TUNGSTEN;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTRODE; INSTRUMENTATION; MICROTECHNOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY;

ELECTROCHEMISTRY; ELECTRODES; MICROTECHNOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY OF RESULTS; TUNGSTEN;

EID: 79551674806 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3529880 Document Type: Article

Times cited : (95)

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