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Applied Physics Letters

Volumn 98, Issue 4, 2011, Pages

Watching bismuth nanowires grow

(6) Ham, Jinhee a Shim, Wooyoung a,b Kim, Do Hyun c Oh, Kyu Hwan c Voorhees, Peter W b Lee, Wooyoung a

a Yonsei University (South Korea)

b Northwestern University (United States)

c Seoul National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BI FILMS; BI NANOWIRES; BISMUTH NANOWIRES; CRYSTALLINITIES; DRIVING FORCES; EXPERIMENTAL EVIDENCE; FILM FORMATIONS; HIGH ASPECT RATIO; HIGH QUALITY; HIGH TEMPERATURE; HILLOCK FORMATION; NANOWIRE GROWTH; THERMALLY INDUCED; UNDERLYING MECHANISM; UNIFORM DIAMETER;

ASPECT RATIO; BISMUTH; GRAIN BOUNDARIES; GRAIN GROWTH; NANOWIRES; SCANNING ELECTRON MICROSCOPY;

FILM GROWTH;

EID: 79551642748 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3535956 Document Type: Article

Times cited : (21)

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