Effect of surface smoothness on tracking mechanism in XLPE-Si-rubber interfaces

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 18, Issue 1, 2011, Pages 176-181

  Du, B X ^a   Zhu, X H ^a   Gu, L ^a   Liu, H J ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

cable joint; carbonization; discharge light; fractal dimension; interface smoothness; silicon rubber; tracking failure; tracking pattern; XLPE

Indexed keywords

CABLE JOINT; DISCHARGE LIGHT; INTERFACE SMOOTHNESS; SILICON RUBBER; TRACKING FAILURE; TRACKING PATTERN; XLPE;

CABLE JOINTING; CABLES; CARBONIZATION; COKE; INITIATORS (CHEMICAL); PARTIAL DISCHARGES; RUBBER;

FRACTAL DIMENSION;

EID: 79551635076     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2011.5704508     Document Type: Article

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