Quantification of damage due to surface tracking

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 14, Issue 5, 2007, Pages 1224-1231

  Rajini, V ^a   Kumar, K Udaya ^b  

^a SSN COLLEGE OF ENGINEERING   (India)

^b ANNA UNIVERSITY   (India)

Author keywords

Box counting method; EPDM; Fractal dimensions; Surface tracking

Indexed keywords

ELECTRIC BREAKDOWN; FRACTALS; MATHEMATICAL MODELS; PROBLEM SOLVING; SURFACE PHENOMENA;

BOX COUNTING METHODS; FRACTAL DIMENSIONS; SURFACE TRACKING;

ELECTRIC INSULATORS;

EID: 35348857076     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2007.4339483     Document Type: Article

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