Further characterizations of sputtered copper beryllium capsules using confocal micro x-ray fluorescence

Fusion Science and Technology

Volumn 59, Issue 1, 2011, Pages 121-125

  Patterson, Brian M ^a   Obrey, Kimberly A ^a   Havrilla, George J ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

3 d analysis; Beryllium sputtered capsule; Confocal micro x ray fluorescence

Indexed keywords

BERYLLIUM; COMPUTERIZED TOMOGRAPHY; DOPING (ADDITIVES); FLUORESCENCE;

3-D ANALYSIS; LINE SCAN; MEASUREMENT NOISE; MICRO X-RAY FLUORESCENCE; NON-DESTRUCTIVE ANALYSIS; X RAY MICRO-COMPUTED TOMOGRAPHY;

COPPER;

EID: 79551526851     PISSN: 15361055     EISSN: None     Source Type: Journal    
DOI: 10.13182/FST11-A11513     Document Type: Conference Paper

References (6)

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