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Volumn 637, Issue 1 SUPPL., 2011, Pages
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Dark-lifetime degradation of GaAs photo-cathode at higher temperature
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Author keywords
Electron source; NEA surface; Photo cathode
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Indexed keywords
ACTIVE COOLING;
AVERAGE CURRENTS;
BUNCH COMPRESSION;
CATHODE TEMPERATURE;
CRITICAL DEVICE;
CRITICAL PROBLEMS;
DESORPTION PROCESS;
ELECTRON BUNCH;
GAAS;
GAAS CRYSTALS;
GAAS SURFACES;
HIGH BRIGHTNESS;
HIGH-AVERAGE POWER LASERS;
HIGHER TEMPERATURES;
LASER COMPTON SCATTERING;
LIFETIME DEGRADATION;
LOW EMITTANCE;
NEA SURFACE;
NEGATIVE ELECTRON AFFINITY;
OPERATIONAL LIFETIME;
PHOTON PULSE;
SHORT PULSE;
SMALL SPOTS;
TEMPERATURE RISE;
W LASERS;
BINDING ENERGY;
DEGRADATION;
DESORPTION;
ELECTRON AFFINITY;
ELECTRON BEAMS;
ELECTRON GUNS;
ELECTRONS;
FREE ELECTRON LASERS;
GALLIUM ALLOYS;
GALLIUM ARSENIDE;
HEATING;
LIGHT SOURCES;
SEMICONDUCTING GALLIUM;
CATHODES;
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EID: 79551474704
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2010.02.029 Document Type: Conference Paper |
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Times cited : (34)
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References (13)
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