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Materials Science Forum

Volumn 615 617, Issue , 2009, Pages 207-210

TEM investigations of graphene on 4H-SiC(0001)

(5) Borysiuk, J a,b Strupinski, W a Bozek, R b Wysmolek, A b Baranowski, J M a

a ukasiewicz Research Network Institute of Microelectronics and Photonics (Poland)

b UNIVERSITY OF WARSAW (Poland)

Author keywords

Graphene layers; Scanning tunneling microscopy; Transmission electron microscopy

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MONOLAYERS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES;

CARBON LAYERS; GRAPHENE LAYERS; HIGH-RESOLUTION TEM; OFF-AXIS; RELATIVE SPACING; SILICON ATOMS; THIN LAYERS; VAN DER WAALS;

GRAPHENE;

EID: 79251559398 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.615-617.207 Document Type: Conference Paper

Times cited : (2)

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