SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 272-276

The effect of thin oxide film on protein sample measurement with TOF-SIMS

(3) Aoyagi, Satoka a Inoue, Masae b Mitsuoka, Takuya b

a SHIMANE UNIVERSITY (Japan)

b Rd Management Section (Japan)

Author keywords

indium tin oxide; protein evaluation; thin oxide film; TOF SIMS

Indexed keywords

CONTROL SAMPLES; EGG WHITE; ELECTRICALLY CONDUCTIVE; FRAGMENT IONS; GLASS PLATE; INDIUM TIN OXIDE; MODEL PROTEINS; POSITIVE ION SPECTRA; PROTEIN MEASUREMENT; PROTEIN SAMPLES; SAMPLE PREPARATION; SECONDARY IONS; SILICON OXIDE THIN FILMS; SILICON PLATES; SILICON SUBSTRATES; STATIC CONDITIONS; THIN OXIDE FILMS; TIME OF FLIGHT; TIME-OF-FLIGHT SIMS; TOF SIMS;

BIOMATERIALS; ENZYMES; FILM PREPARATION; INDIUM; ION SOURCES; ITO GLASS; NEGATIVE IONS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SILICON OXIDES; SUBSTRATES; TIN; TIN OXIDES;

OXIDE FILMS;

EID: 78951491056 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3443 Document Type: Conference Paper

Times cited : (3)

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