TOF-SIMS imaging technique with information entropy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 232, Issue 1-4, 2005, Pages 146-152

  Aoyagi, Satoka ^a   Kawashima, Y ^b   Kudo, Masahiro ^b  

^a SHIMANE UNIVERSITY   (Japan)

^b SEIKEI UNIVERSITY   (Japan)

Author keywords

Chemical imaging; Information entropy; Protein; TOF SIMS

Indexed keywords

ADSORPTION; ELECTRON ENERGY LEVELS; ENTROPY; ESTIMATION; IMAGING TECHNIQUES; INFORMATION THEORY; PRINCIPAL COMPONENT ANALYSIS; PROTEINS;

CHEMICAL IMAGING; CHEMICAL MAPPING; INFORMATION ENTROPY; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

SECONDARY ION MASS SPECTROMETRY;

EID: 19944390630     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.03.037     Document Type: Conference Paper

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