Analysis and fragmentation of organic samples by (low-energy) dynamic SIMS

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 88-91

  Ngo, K Q ^a   Philipp, P ^a   Jin, Y ^b   Morris, S E ^b   Shtein, M ^b   Kieffer, J ^b   Wirtz, T ^a  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

cluster abundance distribution; fragmentation; impact energy; SIMS; sputtering

Indexed keywords

ABUNDANCE DISTRIBUTION; ANALYTICAL TOOL; BIOLOGICAL SAMPLES; COPPER PHTHALOCYANINE; CURRENT PROJECTS; DIMENSIONAL CONTROL; DYNAMIC SIMS; FRAGMENTATION; IMPACT ENERGY; IONIZATION MECHANISMS; LOW ENERGIES; MOLECULAR LEVELS; MULTI-LAYERED STRUCTURE; OPTOELECTRONIC MATERIALS; ORGANIC LAYERS; ORGANIC MOLECULES; ORGANIC OPTOELECTRONICS; ORGANIC PHOTOVOLTAIC CELLS; ORGANIC SAMPLES; SECONDARY IONS; SIMS; STATIC SIMS;

CESIUM; FATIGUE CRACK PROPAGATION; LIGHT EMITTING DIODES; OPTOELECTRONIC DEVICES; PHOTOVOLTAIC CELLS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 78951489328     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3533     Document Type: Conference Paper

References (15)

1. W. O. Hofer, in Sputtering by Particle Bombardment III (Eds:, R. Behrisch, K. Wittmaack,), Springer-Verlag: Berlin Heidelberg, 1991, pp 15.
2. H. M. Urbassek, W. O. Hofer, in Fundamental Processes in Sputtering of Atoms and Molecules (SPUT92) Book series, P. Sigmund, (ed), Kongelige danske videnskabernes selskab: matematisk-Fysiske meddelelser, 1993, 97.
3. M. L. Yu, in Sputtering by Particle Bombardment III (Eds:, R. Behrisch, K. Wittmaack,), Springer-Verlag: Berlin Heidelberg, 1991, pp 91.
4. H. Gnaser, H. Oechsner, Nucl. Instrum. Methods Phys. Res. B 1993, 82, 518.
5. H. Gnaser, Phys. Rev. B 2001, 63, 45415.
6. H. Gnaser, Nucl. Instrum. Methods Phys. Res. B 1999, 149, 38.
7. A. K. Gupta, P. Ayyub, Eur. Phys. J. D 2001, 17, 221.
8. R. Heinrich, C. Staudt, M. Wahl, A. Wucher, Proceeding of the twelve International Conference on Secondary Ion Mass Spectrometry (SIMS XII) 1999, 111.
9. H. Yamamoto, F. Esaka, H. Asaoka, Proceeding of the twelve International Conference on Secondary Ion Mass Spectrometry (SIMS XII) 1999, 295.
10. H. Gnaser, Appl. Surf. Sci. 2003, 203-204, 78.
11. H. Gnaser, Nucl. Instrum. Methods Phys. Res. B 2000, 164, 705.
12. R. Golser, H. Gnaser, W. Kutschera, A. Priller, P. Steier, C. Vockenhuber, Nucl. Instrum. Methods Phys. Res. B 2004, 223-224, 221.
13. E. D. Chambost, B. Boyer, B. Rasser, M. Schuhmacher, Proceeding of the twelve International Conference on Secondary Ion Mass Spectrometry (SIMS XII) 1999, 533.
14. J. Y. Qi, L. Dang, M. D. Chen, W. Wu, Q. E. Zhang, C. T. Au, J. Phys. Chem. A 2008, 112, 12456.
15. C. G. Zhan, S. Iwata, J. Chem. Phys. 1996, 104, 9058.