SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 397-401

Quantitative analysis of the surface composition of mixed self-assembled monolayers using ToF-SIMS and FT-IR analyses

(5) Min, Hyegeun a Yu, Hyunung a Son, Miyoung a,b Moon, Dae Won a Lee, Tae Geol a

a Korea Research Institute of Standards and Science (South Korea)

b Chungnam National University (South Korea)

Author keywords

disulfide; FT IR; mixed SAM; quantification; silane; surface density and spacing; ToF SIMS

Indexed keywords

DISULFIDE; FT-IR; MIXED SAM; QUANTIFICATION; SURFACE DENSITY AND SPACING; TOF SIMS;

ACETYLENE; ADSORBATES; ADSORPTION; BIOASSAY; BIOCHIPS; BIOSENSORS; CHEMICAL ANALYSIS; FUNCTIONAL GROUPS; IONS; LIGHTING; PROPYLENE; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICA;

SELF ASSEMBLED MONOLAYERS;

EID: 78951476363 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3538 Document Type: Conference Paper

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.