Useful yields of organic molecules under dynamic SIMS cluster bombardment

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 376-379

  Gillen, Greg ^a   Szakal, Christopher ^a   Brewer, Tim M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Cluster SIMS; secondary ion mass spectrometry; useful yield

Indexed keywords

ANALYTE MOLECULES; ANALYTES; CLUSTER BOMBARDMENT; CLUSTER SIMS; DYNAMIC SIMS; HIGH DOSE; INK-JET DEPOSITION; INTEGRATED CHARACTERISTICS; MAGNETIC SECTORS; MICRODROPS; ORGANIC MOLECULES; PROBE BEAM; SECONDARY IONS; SPUTTERING CONDITIONS; TOF SIMS; USEFUL YIELD;

COMPASSES (MAGNETIC); DEPOSITS; IONS; MOLECULES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

ION BOMBARDMENT;

EID: 78951474014     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3484     Document Type: Conference Paper

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