Using patents and publications to assess R&D efficiency in the states of the USA

World Patent Information

Volumn 33, Issue 1, 2011, Pages 4-10

  Thomas, V J ^a   Sharma, Seema ^a   Jain, Sudhir K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

American Paradox; American states; BRICS; Patents; R D efficiency; USA

Indexed keywords

EID: 78751702547     PISSN: 01722190     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wpi.2010.01.005     Document Type: Article

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