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Volumn 58, Issue 1, 2011, Pages 226-233

High-spatial-resolution sub-surface imaging using a laser-based acoustic microscopy technique

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC MICROSCOPY; BROADBAND ACOUSTIC WAVES; COUPLING MEDIUM; DETECTION APPROACH; ELASTIC CHARACTERIZATION; ENERGY LOSS; GEOMETRICAL FEATURES; GIGAHERTZ RANGE; HIGH SPATIAL RESOLUTION; MICROMETER-SCALE; OPTICAL GENERATION; OPTICAL INTERFEROMETER; PENETRATION DEPTH; PULSED LASER; PULSED LASER SOURCES; SCANNING ACOUSTIC MICROSCOPY; SINGLE-CRYSTAL SILICON WAFERS; SOLID MEDIA; SPATIAL RESOLUTION; SUB-SURFACE IMAGING;

EID: 78751678040     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2011.1789     Document Type: Article
Times cited : (28)

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