Influence of substrate temperature on structural, optical and electrical properties of evaporated cadmium sulphide thin films

Journal of Optoelectronics and Advanced Materials

Volumn 12, Issue 10, 2010, Pages 2052-2056

  Shah, N M ^a   Ray, J R ^a   Desai, M S ^a   Panchal, C J ^a  

^a M S UNIVERSITY OF BARODA   (India)

Author keywords

CdS thin film; Optical and electrical characterization; Scanning electron microscopy; Substrate temperature; X ray diffraction

Indexed keywords

CADMIUM SULFIDE; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY GAP; HALL MOBILITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; SCANNING ELECTRON MICROSCOPY; SULFUR COMPOUNDS; THERMAL EVAPORATION; THIN FILMS; TRANSMISSIONS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CADMIUM SULPHIDE THIN FILMS; CDS THIN FILMS; ELECTRICAL CHARACTERIZATION; OPTICAL AND ELECTRICAL CHARACTERIZATION; OPTICAL AND ELECTRICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY IMAGE; SUBSTRATE TEMPERATURE; THERMAL EVAPORATION TECHNIQUE;

OPTICAL FILMS;

EID: 78751673024     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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