Preparation and structural characterization of thin-film CdTe/CdS heterojunctions

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 3, 2006, Pages 936-940

  Salaoru, I ^a   Buffat, P A ^b   Laub, D ^b   Amariei, A ^a   Apetroaei, N ^a   Rusu, M ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b EPFL   (Switzerland)

Author keywords

CdS; CdTe; Heterojunctions; Structural properties; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM SULFIDE; CADMIUM TELLURIDE; FILM PREPARATION; GLASS; HETEROJUNCTIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; STRUCTURAL PROPERTIES; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION;

CDTE; CDTE/CDS HETEROJUNCTION; CDTE/CDS THIN FILMS; COATED GLASS SUBSTRATES; HETEROJUNCTION COMPONENTS; STRUCTURAL CHARACTERISTICS; STRUCTURAL CHARACTERIZATION; STRUCTURAL STUDIES;

SULFUR COMPOUNDS;

EID: 33745918957     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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