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Volumn 359, Issue 2, 2000, Pages 160-164
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Microstructure and properties of the CdS thin films prepared by electrostatic spray assisted vapour deposition (ESAVD) method
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FILM PREPARATION;
MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING CADMIUM COMPOUNDS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ELECTROSTATIC SPRAY ASSISTED VAPOR DEPOSITION (ESAVD);
SEMICONDUCTING FILMS;
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EID: 0033889920
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(99)00733-6 Document Type: Article |
Times cited : (72)
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References (16)
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