Estimation of compensation ratio by identifying the presence of different hopping conduction mechanisms in SnO2 thin films

Thin Solid Films

Volumn 519, Issue 7, 2011, Pages 2302-2307

  Serin, N ^a   Yildiz, A ^b   Alsac A A ^a   Serin, T ^a  

^a ANKARA UNIVERSITY   (Turkey)

^b AHI EVRAN UNIVERSITY   (Turkey)

Author keywords

Compensation ratio; Conduction mechanism; Nearest neighbour hopping; Tin oxide; Variable range hopping

Indexed keywords

COMPENSATION RATIO; CONDUCTION MECHANISM; CONDUCTIVITY MEASUREMENTS; CRITICAL TRANSITION TEMPERATURES; ELECTRICAL CONDUCTION; ELECTRICAL PROPERTY; HIGH TEMPERATURE; HOPPING CONDUCTION; HOPPING MODELS; LOW TEMPERATURES; MOTT VARIABLE-RANGE HOPPING; NEAREST-NEIGHBOUR; OPTICAL ABSORPTION SPECTROSCOPY; ORDERS OF MAGNITUDE; SOL-GEL TECHNIQUE; STRUCTURAL CHARACTERIZATION; TEMPERATURE RANGE; VARIABLE-RANGE HOPPING;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; OPTICAL PROPERTIES; THIN FILMS; TIN; TIN OXIDES; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ABSORPTION SPECTROSCOPY;

EID: 78751643064     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.11.027     Document Type: Article

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